Invention Grant
US07884699B2 Variable resistor element, manufacturing method thereof, and memory device provided with it 有权
可变电阻元件及其制造方法以及设置有该电阻元件的存储器件

  • Patent Title: Variable resistor element, manufacturing method thereof, and memory device provided with it
  • Patent Title (中): 可变电阻元件及其制造方法以及设置有该电阻元件的存储器件
  • Application No.: US11997184
    Application Date: 2006-07-21
  • Publication No.: US07884699B2
    Publication Date: 2011-02-08
  • Inventor: Yasunari Hosoi
  • Applicant: Yasunari Hosoi
  • Applicant Address: JP Osaka
  • Assignee: Sharp Kabushiki Kaisha
  • Current Assignee: Sharp Kabushiki Kaisha
  • Current Assignee Address: JP Osaka
  • Agency: Nixon & Vanderhye P.C.
  • Priority: JP2005-228600 20050805
  • International Application: PCT/JP2006/314487 WO 20060721
  • International Announcement: WO2007/018026 WO 20070215
  • Main IPC: H01C7/10
  • IPC: H01C7/10
Variable resistor element, manufacturing method thereof, and memory device provided with it
Abstract:
A variable resistor element comprising a first electrode, a second electrode, and a variable resistor positioned between the first and second electrodes, and changing in electric resistance when a voltage pulse is applied between the both electrodes, has posed problems that it has a restriction of having to use noble metal electrodes as an electrode material and is not compatible with a conventional CMOS process. A variable resistor element using an oxynitride of transition metal element as a variable resistor exhibits a stable switching operation, is satisfactory in data retaining characteristics, and requires a small programming current. Since it does not necessarily require noble metal as an electrode material, it is high in compatibility with the existing CMOS process and easy to produce. It can be formed by a simple step of forming a variable resistor material into a film by oxidizing a lower electrode surface consisting of conductive nitride.
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