Invention Grant
- Patent Title: Lithographic apparatus and device manufacturing method
- Patent Title (中): 光刻设备和器件制造方法
-
Application No.: US11350278Application Date: 2006-02-09
-
Publication No.: US07884919B2Publication Date: 2011-02-08
- Inventor: Peter Hempenius , Marcel Koenraad Marie Baggen , Dirk-Jan Bijvoet , Sjoerd Nicolaas Lambertus Donders , Youssef Karel Maria De Vos
- Applicant: Peter Hempenius , Marcel Koenraad Marie Baggen , Dirk-Jan Bijvoet , Sjoerd Nicolaas Lambertus Donders , Youssef Karel Maria De Vos
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- Main IPC: G03B27/42
- IPC: G03B27/42

Abstract:
A device manufacturing method includes transferring a pattern from a patterning device onto a substrate. The method includes bringing the patterning device and the support together, and applying a substantially stationary force between the patterning device and the support to hold the patterning device. The patterning device is now excited by a substantially dynamic force to enable a micro slipping thereof. Then, the patterning device is aligned, and the pattern is transferred from the patterning device onto the substrate. The patterning device may be excited with an alternating acceleration. When the patterning device is excited, the patterning device is allowed to settle with respect to the support, thereby improving a friction therebetween to reduce a risk of slipping or local slipping of the patterning device.
Public/Granted literature
- US20070182947A1 Lithographic apparatus and device manufacturing method Public/Granted day:2007-08-09
Information query