A measuring system for photoelectrically scanning measurement points of a measurement object includes a lighting channel (21-24) for applying illuminating light to the measurement object (M) disposed in a measurement plane (MP) and a measuring channel (11-13) for capturing and photoelectrically converting the measurement light reflected by the measurement points of the measurement object M. The lighting channel and/or the measuring channel is configured so as to detect the reflection properties of the measurement points in several wavelength bands. The lighting channel (21-24) has a spatial light modulator controlled by an electronic control unit (40) for generating a spatial lighting pattern which causes illuminating light to be selectively applied to measurements points (25) of interest of the measurement object (M). The control unit (40) may be equipped with image processing functions and be configured to identify measurement points (25) suitable for the application purpose from image data of the measurement object (M) and to calculate corresponding lighting patterns for selectively illuminating the measurement points.