Invention Grant
- Patent Title: Probe apparatus and terahertz spectrometer
- Patent Title (中): 探测仪和太赫兹光谱仪
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Application No.: US12368839Application Date: 2009-02-10
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Publication No.: US07884942B2Publication Date: 2011-02-08
- Inventor: Tomoyuki Umetsu
- Applicant: Tomoyuki Umetsu
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: K&L Gates LLP
- Priority: JP2008-053803 20080304
- Main IPC: G01N21/55
- IPC: G01N21/55
Abstract:
A probe apparatus includes a first focusing lens and a second focusing lens. The first focusing lens is arranged on a surface of a base to which a terahertz excitation beam is applied, the surface being opposite to the surface to which terahertz excitation beam is applied, with the lens axis deviated from the center of a point at which the terahertz excitation beam is applied. The second focusing lens is arranged on a surface of a base to which a terahertz detected beam is applied from a source of the terahertz excitation beam, the surface being opposite to the surface to which the terahertz detected beam is applied, with the lens axis deviated from the center of a point at which the terahertz detected beam is applied, in a direction opposite to the direction in which the lens axis of the first focusing lens is deviated.
Public/Granted literature
- US20090225311A1 PROBE APPARATUS AND TERAHERTZ SPECTROMETER Public/Granted day:2009-09-10
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