Invention Grant
- Patent Title: Three-dimensional image measuring apparatus
- Patent Title (中): 三维图像测量仪
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Application No.: US12254324Application Date: 2008-10-20
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Publication No.: US07884949B2Publication Date: 2011-02-08
- Inventor: Kwang-Ill Koh , Eun-Hyoung Seong , Moon-Young Jeon
- Applicant: Kwang-Ill Koh , Eun-Hyoung Seong , Moon-Young Jeon
- Applicant Address: KR Seoul
- Assignee: Koh Young Technology Inc.
- Current Assignee: Koh Young Technology Inc.
- Current Assignee Address: KR Seoul
- Agency: Kile Park Goekjian Reed & McManus PLLC
- Priority: KR2003-0007570 20030206; KR2003-0007571 20030206
- Main IPC: G01B11/24
- IPC: G01B11/24

Abstract:
The present invention relates to a three-dimensional image measuring apparatus comprising: an XYZ shaft transfer means mounted onto a base member; a work stage mounted to the base member, for moving a measuring object to a measuring position and thereafter supporting it and having a predetermined reference surface set at a side thereof; an image obtaining means in which it is moved toward X,Y and Z shafts by the XYZ shaft transfer means, scans a grating image by the frequency of N times to a side of the measuring object supported and fixed to the work stage, obtains the changed grating image by the measuring object by N times; a light emitting means mounted to a side of the image obtaining means for generating and emitting light with a predetermined wavelength; and a control unit which irradiates light generated from the light emitting means mounted to a side of the image obtaining means to the reference surface set the side of the work stage, receives the changed grating image obtained from the image obtaining means, thereby producing the three-dimensional image.
Public/Granted literature
- US20090051929A1 THREE-DIMENSIONAL IMAGE MEASURING APPARATUS Public/Granted day:2009-02-26
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