Invention Grant
US07885100B2 Phase change random access memory and layout method of the same 有权
相变随机存取存储器和布局方法相同

  • Patent Title: Phase change random access memory and layout method of the same
  • Patent Title (中): 相变随机存取存储器和布局方法相同
  • Application No.: US12332787
    Application Date: 2008-12-11
  • Publication No.: US07885100B2
    Publication Date: 2011-02-08
  • Inventor: Hae Chan Park
  • Applicant: Hae Chan Park
  • Applicant Address: KR Gyeonggi-do
  • Assignee: Hynix Semiconductor Inc.
  • Current Assignee: Hynix Semiconductor Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Agency: Ladas & Parry LLP
  • Priority: KR10-2008-0023040 20080312; KR10-2008-0023042 20080312
  • Main IPC: G11C11/00
  • IPC: G11C11/00
Phase change random access memory and layout method of the same
Abstract:
A phase change random access memory (PRAM) includes a cell array divided into an active region and a dummy active region. A bitline is formed across the active region and the dummy active region and a global wordline is formed in the active region so as to intersect with the bitline. The cell array includes a phase change memory cell formed at an intersection point of the bitline and the global wordline that is electrically connected with the bitline and the global wordline. The cell array further includes a phase change dummy cell formed below the bitline in the dummy active region that is electrically isolated from the bitline. The dummy cell maintains a turn-off state as the dummy cell and the bitline are electrically isolated from each other.
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