Invention Grant
US07885437B2 Fingerprint collation apparatus, fingerprint pattern area extracting apparatus and quality judging apparatus, and method and program of the same 有权
指纹对照装置,指纹图案区域提取装置和质量判断装置及其方法和程序

  • Patent Title: Fingerprint collation apparatus, fingerprint pattern area extracting apparatus and quality judging apparatus, and method and program of the same
  • Patent Title (中): 指纹对照装置,指纹图案区域提取装置和质量判断装置及其方法和程序
  • Application No.: US11679421
    Application Date: 2007-02-27
  • Publication No.: US07885437B2
    Publication Date: 2011-02-08
  • Inventor: Masanori Hara
  • Applicant: Masanori Hara
  • Applicant Address: JP Tokyo
  • Assignee: NEC Corporation
  • Current Assignee: NEC Corporation
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • Priority: JP2006-050391 20060227
  • Main IPC: G06K9/00
  • IPC: G06K9/00 G06K9/46
Fingerprint collation apparatus, fingerprint pattern area extracting apparatus and quality judging apparatus, and method and program of the same
Abstract:
To enable extraction of a specific area (pattern area) that includes a characteristic part of the inherent pattern of individual fingerprint from an inputted fingerprint image of a human being or other creature. The pattern area is extracted as the minimum area that is surrounded by a right pattern area slope, a left pattern area slope, and pattern area bases. The right (left) pattern area slope is a fingerprint ridge which runs towards the outside on the right (left) side from the start point that is located on the upper side of the center point of the fingerprint image, and satisfies a prescribed condition. The pattern area base is a fingerprint ridge which runs on the lower side of the center and satisfies a prescribed condition.
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