Invention Grant
- Patent Title: Sleeve cone quality measurement system and method
- Patent Title (中): 袖锥质量测量系统及方法
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Application No.: US12252046Application Date: 2008-10-15
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Publication No.: US07885786B2Publication Date: 2011-02-08
- Inventor: Ananda V. Mysore , Steve G. Gonzalez , Reid E. Berry, II , Hans Leuthold
- Applicant: Ananda V. Mysore , Steve G. Gonzalez , Reid E. Berry, II , Hans Leuthold
- Applicant Address: US CA Scotts Valley
- Assignee: Seagate Technology LLC
- Current Assignee: Seagate Technology LLC
- Current Assignee Address: US CA Scotts Valley
- Main IPC: G01B7/00
- IPC: G01B7/00 ; G01B5/004

Abstract:
A metrology system for measuring a cone angle, a cone straightness, and a cone quality of a sample and method of using the metrology system are disclosed. The system includes a rotary stage, one or more workpiece fixtures that hold the samples in the rotary stage, and a number of different sized measurement devices. The measuring devices are positioned next to the rotary stage and measure the samples using contact. The rotary stage is free to rotate when the measuring devices are in a non-measuring state. The invention also includes a processor that collects data from the measurement devices and calculates the cone angle, the cone straightness, and the cone quality of each sample based on the data.
Public/Granted literature
- US20100094587A1 SLEEVE CONE QUALITY MEASUREMENT SYSTEM AND METHOD Public/Granted day:2010-04-15
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