Invention Grant
- Patent Title: Recipe parameter management system and recipe parameter management method
- Patent Title (中): 配方参数管理系统和配方参数管理方法
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Application No.: US12430701Application Date: 2009-04-27
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Publication No.: US07885789B2Publication Date: 2011-02-08
- Inventor: Tomohiro Funakoshi
- Applicant: Tomohiro Funakoshi
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Miles & Stockbridge P.C.
- Priority: JP2008-122657 20080508
- Main IPC: G06F17/18
- IPC: G06F17/18 ; G06F11/30 ; G21C17/00

Abstract:
In operation to obtain an optimal observation condition in a review system, the number of trial reviews can be reduced to improve efficiency of the operation. For a defect review conducted by the review system, a recipe parameter management system stores, as recipe parameter setting history in a recipe parameter setting history database (DB), a recipe parameter setting values of recipe parameters set when the defect review is conducted, the number of trial reviews carried out until the recipe parameter setting values are set, and defect images obtained when the defect review is conducted. The apparatus displays, on a terminal, histograms and the numbers of trial reviews generated based on the recipe parameter setting history data stored in the recipe parameter setting history database (DB). Hence, the operator can easily obtain data regarding the recipe parameter setting in the past.
Public/Granted literature
- US20090281755A1 RECIPE PARAMETER MANAGEMENT SYSTEM AND RECIPE PARAMETER MANAGEMENT METHOD Public/Granted day:2009-11-12
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