Invention Grant
- Patent Title: Throughput measurement of a total number of data bits communicated during a communication period
- Patent Title (中): 在通信期间传送的数据位的总数的吞吐量测量
-
Application No.: US12188265Application Date: 2008-08-08
-
Publication No.: US07886096B2Publication Date: 2011-02-08
- Inventor: Salil Shirish Gadgil
- Applicant: Salil Shirish Gadgil
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Robert D. Marshall, Jr.; W. James Brady; Frederick J. Telecky, Jr.
- Main IPC: G06F13/42
- IPC: G06F13/42 ; H04B17/00

Abstract:
A method, system, and apparatus to hardware initiated throughput (HITM) measurement inside an OCP system using OCP side band signals are disclosed. In one embodiment, a system of an integrated circuit includes a signal line located in the integrated circuit to communicate an electrical signal, a receiver circuit located in the integrated circuit coupled to the signal line, a transmitter module located in the integrated circuit to communicate a data stream to the receiver circuit through the signal line, and a throughput monitor circuit coupled to the signal line to measure a throughput value during a communication period of the data stream from the transmitter module. The system may include a processor module located in the integrated circuit configured to interrupt an operation of the transmitter module and a receiver module if the throughput monitor circuit generates the interrupt signal.
Public/Granted literature
- US20100034248A1 HARDWARE INITIATED THROUGHPUT (HITM) MEASUREMENT INSIDE AN OCP SYSTEM USING OCP SIDE BAND SIGNALS Public/Granted day:2010-02-11
Information query