A component test apparatus performing a test on an electronic component is disclosed. The component test apparatus includes a component loading device, a transport hand, and a component unloading device. The transport hand includes a plurality of index units each one of which is capable of holding the electronic component and operating independently from the other ones of the index units. The index units are aligned adjacently in a transport direction of the electronic component extending from a loading position at which the component loading device loads the electronic component toward a test position at which a test socket is provided.