Invention Grant
- Patent Title: Construction of colorimetric measurements from device profile of spectral measurements
- Patent Title (中): 从光谱测量的设备概况构建比色测量
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Application No.: US11643908Application Date: 2006-12-22
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Publication No.: US07889387B2Publication Date: 2011-02-15
- Inventor: John S. Haikin
- Applicant: John S. Haikin
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Main IPC: G03F3/08
- IPC: G03F3/08 ; H04N1/46 ; H04N1/40 ; G09G5/02

Abstract:
A device model object which numerically constructs colorimetric measurements based on access to a spectrally-based device profile. In situations where a color management module issues a request for spectral measurements, then the device model object provides spectral measurements directly from the spectrally-based device profile. However, in situations where the color management module issues a request for colorimetric measurements, then the device model object numerically constructs colorimetric measurements based on numerical integration of spectral measurements from the spectrally-based device profile against a viewing condition white point. The constructed measurements are provided to the color management module and they are also cached for possible future use. In this way, the device model object is able to support requests for both measurement-based device profiles and spectrally-based device profiles.
Public/Granted literature
- US20080151275A1 Construction of colorimetric measurements from device profile of spectral measurements Public/Granted day:2008-06-26
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