Invention Grant
- Patent Title: Semiconductor integrated circuit for supporting a test mode
- Patent Title (中): 半导体集成电路支持测试模式
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Application No.: US12327730Application Date: 2008-12-03
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Publication No.: US07889534B2Publication Date: 2011-02-15
- Inventor: Taek-Seung Kim
- Applicant: Taek-Seung Kim
- Applicant Address: KR
- Assignee: Hynix Semiconductor Inc.
- Current Assignee: Hynix Semiconductor Inc.
- Current Assignee Address: KR
- Agency: Baker & McKenzie LLP
- Priority: KR10-2008-0022587 20080311
- Main IPC: G11C7/00
- IPC: G11C7/00
Abstract:
A semiconductor integrated circuit for supporting a test mode includes a program region including at least one One Time Programmable Cell Array, and a program region control unit configured to activate the program region in response to an enabled fuse signal of a fuse corresponding to the program region, and to activate the program region in response to a test mode signal of the program region.
Public/Granted literature
- US20090231901A1 SEMICONDUCTOR INTEGRATED CIRCUIT FOR SUPPORTING A TEST MODE Public/Granted day:2009-09-17
Information query
