Invention Grant
- Patent Title: Memory, memory operating method, and memory system
- Patent Title (中): 内存,内存操作方法和内存系统
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Application No.: US12502592Application Date: 2009-07-14
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Publication No.: US07889568B2Publication Date: 2011-02-15
- Inventor: Keisuke Watanabe
- Applicant: Keisuke Watanabe
- Applicant Address: JP Yokohama
- Assignee: Fujitsu Semiconductor Limited
- Current Assignee: Fujitsu Semiconductor Limited
- Current Assignee Address: JP Yokohama
- Agency: Arent Fox LLP
- Priority: JP2008-247604 20080926
- Main IPC: G11C16/06
- IPC: G11C16/06

Abstract:
A memory includes a plurality of memory cells each of which includes a memory transistor and a selection transistor; a control gate line; a selection gate line; a source line; a bit line; a first driver that sets the control gate line and the selection gate line at a first voltage in a program operation; a second driver that sets the source line at a second voltage in the program operation, and sets the source line at a third voltage higher than the second voltage while the control gate line and the selection gate line are set at the first voltage; and a third driver that sets the bit line at a fourth voltage after the source line is set at the second voltage, the bit line being coupled to a memory cell being programmed.
Public/Granted literature
- US20100080066A1 MEMORY, MEMORY OPERATING METHOD, AND MEMORY SYSTEM Public/Granted day:2010-04-01
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