Invention Grant
US07889825B2 Methods for adjusting sampling clock of sampling circuit and related apparatuses 有权
调整采样电路采样时钟及相关设备的方法

  • Patent Title: Methods for adjusting sampling clock of sampling circuit and related apparatuses
  • Patent Title (中): 调整采样电路采样时钟及相关设备的方法
  • Application No.: US11733775
    Application Date: 2007-04-11
  • Publication No.: US07889825B2
    Publication Date: 2011-02-15
  • Inventor: Ming-Lun Tsai
  • Applicant: Ming-Lun Tsai
  • Applicant Address: TW Science Park, HsinChu
  • Assignee: Realtek Semiconductor Corp.
  • Current Assignee: Realtek Semiconductor Corp.
  • Current Assignee Address: TW Science Park, HsinChu
  • Agent Winston Hsu; Scott Margo
  • Priority: TW95112850A 20060411
  • Main IPC: H04L7/00
  • IPC: H04L7/00
Methods for adjusting sampling clock of sampling circuit and related apparatuses
Abstract:
Methods for adjusting a sampling clock of a sampling circuit and related apparatuses are disclosed. One proposed method includes: calculating difference between adjacent sampled values, generated from the sampling circuit by sampling an incoming signal based on the sampling clock, to obtain a plurality of differences; performing a predetermined calculation on the differences to generate a calculated value, the differences including a first difference with a first absolute value and a second difference with a second absolute value less than the first absolute value, and the predetermined calculation causing that a ratio of component of the calculated value contributed by the first difference to component of the calculated value contributed by the second difference to be greater than a ratio of the first absolute value to the second absolute value; and adjusting phase of the sampling clock so that the calculated value generated by the predetermined calculation satisfies predetermined conditions.
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