Invention Grant
- Patent Title: Methods for adjusting sampling clock of sampling circuit and related apparatuses
- Patent Title (中): 调整采样电路采样时钟及相关设备的方法
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Application No.: US11733775Application Date: 2007-04-11
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Publication No.: US07889825B2Publication Date: 2011-02-15
- Inventor: Ming-Lun Tsai
- Applicant: Ming-Lun Tsai
- Applicant Address: TW Science Park, HsinChu
- Assignee: Realtek Semiconductor Corp.
- Current Assignee: Realtek Semiconductor Corp.
- Current Assignee Address: TW Science Park, HsinChu
- Agent Winston Hsu; Scott Margo
- Priority: TW95112850A 20060411
- Main IPC: H04L7/00
- IPC: H04L7/00

Abstract:
Methods for adjusting a sampling clock of a sampling circuit and related apparatuses are disclosed. One proposed method includes: calculating difference between adjacent sampled values, generated from the sampling circuit by sampling an incoming signal based on the sampling clock, to obtain a plurality of differences; performing a predetermined calculation on the differences to generate a calculated value, the differences including a first difference with a first absolute value and a second difference with a second absolute value less than the first absolute value, and the predetermined calculation causing that a ratio of component of the calculated value contributed by the first difference to component of the calculated value contributed by the second difference to be greater than a ratio of the first absolute value to the second absolute value; and adjusting phase of the sampling clock so that the calculated value generated by the predetermined calculation satisfies predetermined conditions.
Public/Granted literature
- US20070237276A1 METHODS FOR ADJUSTING SAMPLING CLOCK OF SAMPLING CIRCUIT AND RELATED APPARATUSES Public/Granted day:2007-10-11
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