Invention Grant
US07889838B2 Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source 有权
干涉仪用于定量相位成像和断层摄影与非相干多色X射线源

  • Patent Title: Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
  • Patent Title (中): 干涉仪用于定量相位成像和断层摄影与非相干多色X射线源
  • Application No.: US11921709
    Application Date: 2006-05-30
  • Publication No.: US07889838B2
    Publication Date: 2011-02-15
  • Inventor: Christian DavidFranz PfeifferTimm Weitkamp
  • Applicant: Christian DavidFranz PfeifferTimm Weitkamp
  • Applicant Address: CH illigen PSI
  • Assignee: Paul Scherrer Institut
  • Current Assignee: Paul Scherrer Institut
  • Current Assignee Address: CH illigen PSI
  • Agent Laurence A. Greenberg; Werner H. Stemer; Ralph E. Locher
  • Priority: EP05012121 20050606
  • International Application: PCT/EP2006/005119 WO 20060530
  • International Announcement: WO2006/131235 WO 20061214
  • Main IPC: G03H5/00
  • IPC: G03H5/00
Interferometer for quantitative phase contrast imaging and tomography with an incoherent polychromatic x-ray source
Abstract:
An interferometer for X-rays, in particular hard X-rays, for obtaining quantitative phase contrast images, includes a standard polychromatic X-ray source, a diffractive optical beam splitter other than a Bragg crystal in transmission geometry, and a position-sensitive detector with spatially modulated detection sensitivity.
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