Invention Grant
- Patent Title: Method and apparatus for identifying pathology in brain images
- Patent Title (中): 用于识别脑图像病理学的方法和装置
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Application No.: US10582725Application Date: 2003-12-12
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Publication No.: US07889895B2Publication Date: 2011-02-15
- Inventor: Wieslaw Lucjan Nowinski , Qingmao Hu
- Applicant: Wieslaw Lucjan Nowinski , Qingmao Hu
- Applicant Address: SG Centros
- Assignee: Agency for Science, Technology and Research
- Current Assignee: Agency for Science, Technology and Research
- Current Assignee Address: SG Centros
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- International Application: PCT/SG03/00284 WO 20031212
- International Announcement: WO2005/057498 WO 20050623
- Main IPC: G06K9/00
- IPC: G06K9/00 ; A61B5/05

Abstract:
A method and apparatus for identifying pathology in a brain image comprises the steps of firstly determining the location of the midsagittal plane (MSP) of the brain illustrated in the image under examination by identifying the symmetry of the two hemispheres based on the determination of up to 16 approximated fissure line segments (AFLSs). Those AFLSs with a larger angular deviation from the MSP than a predefined threshold are considered as outlier AFLSs while the rest are taken as inlier AFLSs. The ratio of the number of the outlier AFLSs to the number of inlier AFLSs is then calculated. A comparison of the ratio with a further predetermined threshold value is made and if the ratio exceeds the further predetermined threshold value, pathology is present in the brain image.
Public/Granted literature
- US20070280518A1 Method and Apparatus for Identifying Pathology in Brain Images Public/Granted day:2007-12-06
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