Invention Grant
- Patent Title: Method for quantifying hole flow rates in film cooled parts
- Patent Title (中): 定影薄膜冷却部件孔流速的方法
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Application No.: US12413756Application Date: 2009-03-30
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Publication No.: US07890274B2Publication Date: 2011-02-15
- Inventor: Ronald Scott Bunker , Jason Randolph Allen , Jared Michael Crosby
- Applicant: Ronald Scott Bunker , Jason Randolph Allen , Jared Michael Crosby
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Penny A. Clarke
- Main IPC: G01N25/00
- IPC: G01N25/00 ; G06F19/00

Abstract:
A method for measuring a flow rate through a cooling hole of a film cooled part includes the steps of 1) measuring a transient thermal response of an internal surface temperature corresponding solely to an inside portion of a cooling hole for a film cooled part resulting from a flow of fluid through the part, the fluid having an initial temperature that is different from an initial temperature of the film cooled part, 2) mathematically characterizing the transient thermal response, and 3) determining the cooling hole flow rate from the mathematical characterization.
Public/Granted literature
- US20100250155A1 METHOD FOR QUANTIFYING HOLE FLOW RATES IN FILM COOLED PARTS Public/Granted day:2010-09-30
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