Invention Grant
- Patent Title: Shape measuring apparatus and method for eyeglass element
- Patent Title (中): 眼镜元件形状测量装置及方法
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Application No.: US12465686Application Date: 2009-05-14
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Publication No.: US07895758B2Publication Date: 2011-03-01
- Inventor: Takahiro Watanabe
- Applicant: Takahiro Watanabe
- Applicant Address: JP Itabashi-ku, Tokyo
- Assignee: Kabushiki Kaisha TOPCON
- Current Assignee: Kabushiki Kaisha TOPCON
- Current Assignee Address: JP Itabashi-ku, Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: JP2008-127656 20080514; JP2009-071194 20090324
- Main IPC: G01B5/20
- IPC: G01B5/20

Abstract:
A shape measuring apparatus for eyeglass element is configured to three-dimensionally measure an inner circumferential contour shape of an eyeglass element. The apparatus includes a holder which holds the eyeglass element; a measuring element which traces a shape of the eyeglass element; a driver for the measuring element; a position detector which detects a position of the measuring element; an arithmetic controller which processes positional data on the measuring element and controls the driver to slide the measuring element, a moving amount detector which detects a moving amount of the measuring element per unit time when the measuring element moves towards the eyeglass element; and a movement controller which controls the measuring element to move at a desirable speed which corresponds to the moving amount per unit time detected by the moving amount detector.
Public/Granted literature
- US20090282688A1 SHAPE MEASURING APPARATUS AND METHOD FOR EYEGLASS ELEMENT Public/Granted day:2009-11-19
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