Invention Grant
- Patent Title: Measuring instrument
- Patent Title (中): 测量仪器
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Application No.: US12379795Application Date: 2009-03-02
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Publication No.: US07895764B2Publication Date: 2011-03-01
- Inventor: Kazuhiro Ishizu , Takeshi Yamamoto
- Applicant: Kazuhiro Ishizu , Takeshi Yamamoto
- Applicant Address: JP Kawasaki-shi
- Assignee: Mitutoyo Corporation
- Current Assignee: Mitutoyo Corporation
- Current Assignee Address: JP Kawasaki-shi
- Agency: Oliff & Berridge, PLC
- Priority: JP2008-060695 20080311
- Main IPC: G01B5/004
- IPC: G01B5/004

Abstract:
A measuring instrument includes: an XY stage on which an object to be measured is placed; a probe holder having a plurality of probes; and a relative moving mechanism that relatively moves the XY stage and the probe holder. The probe holder is provided with a probe selection mechanism that has two guide rails obliquely arranged and advances and retracts at least two of the probes to be selectively positioned at and away from a probe selection position.
Public/Granted literature
- US20090229138A1 Measuring instrument Public/Granted day:2009-09-17
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