Invention Grant
- Patent Title: Pressing head structure for testing key durability
- Patent Title (中): 压头结构,用于测试关键耐久性
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Application No.: US12348636Application Date: 2009-01-05
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Publication No.: US07895901B2Publication Date: 2011-03-01
- Inventor: Lei Li , Zhi-Qiang Jiang , Hai-Ri Huang , Yong Wang
- Applicant: Lei Li , Zhi-Qiang Jiang , Hai-Ri Huang , Yong Wang
- Applicant Address: CN ShenZhen, Guangdong Province HK Kowloon
- Assignee: Shenzhen Futaihong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- Current Assignee: Shenzhen Futaihong Precision Industry Co., Ltd.,FIH (Hong Kong) Limited
- Current Assignee Address: CN ShenZhen, Guangdong Province HK Kowloon
- Agent D. Austin Bonderer
- Priority: CN200810301731 20080523
- Main IPC: G01N3/08
- IPC: G01N3/08

Abstract:
A pressing head structure (100) for testing key durability includes a pressing mechanism (10), a rubber head (40), a connecting mechanism (20) and a balance mechanism (30). The pressing mechanism includes a sliding rod (12) and a first spring (16). The first spring is placed over the sliding rod. The connecting mechanism connects the pressing mechanism and the rubber head. The balance mechanism is rotatably fixed to the connecting mechanism. The balance mechanism engages with the pressing mechanism. When the sliding rod moves down, the first spring and the balance mechanism together supply an unaltered resultant resistance in the moving direction of the sliding rod.
Public/Granted literature
- US20090290248A1 PRESSING HEAD STRUCTURE FOR TESTING KEY DURABILITY Public/Granted day:2009-11-26
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