Invention Grant
- Patent Title: Device manufacturing method and computer program product
- Patent Title (中): 设备制造方法和计算机程序产品
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Application No.: US11435296Application Date: 2006-05-17
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Publication No.: US07897058B2Publication Date: 2011-03-01
- Inventor: Richard Johannes Franciscus Van Haren , Maurits Van Der Schaar , Ewoud Vreugdenhil , Harry Sewell
- Applicant: Richard Johannes Franciscus Van Haren , Maurits Van Der Schaar , Ewoud Vreugdenhil , Harry Sewell
- Applicant Address: NL Veldhoven NL Veldhoven
- Assignee: ASML Netherlands B.V.,ASML Holding NV
- Current Assignee: ASML Netherlands B.V.,ASML Holding NV
- Current Assignee Address: NL Veldhoven NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: C23F1/00
- IPC: C23F1/00 ; G06F19/00 ; B44C1/22 ; G01L21/30

Abstract:
A method of forming features, e.g. contact holes, at a higher density than is possible with conventional lithographic techniques involves forming an array of sacrificial positive features, conformally depositing a sacrificial layer so that negative features are formed interleaved with the positive features, directionally etching the sacrificial layer and removing the sacrificial features. The result is an array of holes at a higher density than the original sacrificial features. These may then be transferred into the underlying substrate using a desired process. Also, the method may be repeated to create arrays at even higher densities.
Public/Granted literature
- US20070187358A1 Device manufacturing method and computer program product Public/Granted day:2007-08-16
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