Invention Grant
US07897217B2 Method and system for performing plasma enhanced atomic layer deposition
有权
用于执行等离子体增强原子层沉积的方法和系统
- Patent Title: Method and system for performing plasma enhanced atomic layer deposition
- Patent Title (中): 用于执行等离子体增强原子层沉积的方法和系统
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Application No.: US11281342Application Date: 2005-11-18
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Publication No.: US07897217B2Publication Date: 2011-03-01
- Inventor: Jacques Faguet
- Applicant: Jacques Faguet
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: H05H1/24
- IPC: H05H1/24

Abstract:
A method, computer readable medium, and system for vapor deposition on a substrate that introduce a gaseous film precursor to a process space, increase the volume of the process space from a first size to a second size to form an enlarged process space, introduce a reduction gas to the enlarged process space, and form a reduction plasma from the reduction gas. The system for vapor deposition includes a process chamber including a first process space and further including a second process space that includes the first process space and that has a second volume that exceeds the first volume. The first process space is configured for atomic layer deposition, and the second process space is configured for plasma reduction of a layer deposited in the first process space.
Public/Granted literature
- US20070116887A1 Method and system for performing plasma enhanced atomic layer deposition Public/Granted day:2007-05-24
Information query
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