Invention Grant
US07897323B2 Lithographic method 有权
平版印刷法

  • Patent Title: Lithographic method
  • Patent Title (中): 平版印刷法
  • Application No.: US11720315
    Application Date: 2005-11-10
  • Publication No.: US07897323B2
    Publication Date: 2011-03-01
  • Inventor: David Van SteenwinckelPeter Zandbergen
  • Applicant: David Van SteenwinckelPeter Zandbergen
  • Applicant Address: NL Eindhoven
  • Assignee: NXP B.V.
  • Current Assignee: NXP B.V.
  • Current Assignee Address: NL Eindhoven
  • Priority: GB0425864.6 20041125; EP05102563 20050331
  • International Application: PCT/IB2005/053700 WO 20051110
  • International Announcement: WO2006/056905 WO 20060601
  • Main IPC: G03F7/26
  • IPC: G03F7/26
Lithographic method
Abstract:
A method of achieving frequency doubled lithographic patterning is described. An optical pattern (16) having a first period (p1) is used to expose conventional acid-catalysed photoresist (18) on substrate (20), leaving regions of high exposure (24), regions of low exposure (26) and intermediate regions (22). Processing proceeds leaving regions (24) which received high exposure very polar, i.e. hydrophilic, regions (26) of low exposure very apolar, i.e. hydrophobic, and the intermediate regions having intermediate polarity. A developer of intermediate polarity such as propylene glycol methyl ether acetate is then used to dissolve only the intermediate regions (22) leaving photoresist patterned to have a pitch (p2) half that of the optical period (p1). Alternatively, the photoresist is removed from the apolar and polar regions leaving only the intermediate regions (22) again with the same pitch (p2) half that of the optical period (p1).
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