Invention Grant
- Patent Title: Production method of semiconductor device and semiconductor device
- Patent Title (中): 半导体器件和半导体器件的制造方法
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Application No.: US11883483Application Date: 2006-01-17
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Publication No.: US07897443B2Publication Date: 2011-03-01
- Inventor: Masao Moriguchi , Yutaka Takafuji , Steven Roy Droes
- Applicant: Masao Moriguchi , Yutaka Takafuji , Steven Roy Droes
- Applicant Address: JP Osaka
- Assignee: Sharp Kabushiki Kaisha
- Current Assignee: Sharp Kabushiki Kaisha
- Current Assignee Address: JP Osaka
- Agency: Nixon & Vanderhye P.C.
- Priority: JP2005-128135 20050426
- International Application: PCT/JP2006/300537 WO 20060117
- International Announcement: WO2006/117900 WO 20061109
- Main IPC: H01L21/762
- IPC: H01L21/762

Abstract:
The present invention provides a production method of a semiconductor device, which can improve characteristics of a semiconductor element including a single crystal semiconductor layer formed by transferring on an insulating substrate. The present invention is a production method of a semiconductor device comprising a single crystal semiconductor layer formed on an insulating substrate, the production method comprising the steps of: implanting a substance for separation into a single crystal semiconductor substrate, thereby forming a separation layer; transferring a part of the single crystal semiconductor substrate, separated at the separation layer, onto the insulating substrate, thereby forming the single crystal semiconductor layer; forming a hydrogen-containing layer on at least one side of the single crystal semiconductor layer; and diffusing hydrogen from the hydrogen-containing layer to the single crystal semiconductor layer.
Public/Granted literature
- US20080149928A1 Production Method of Semiconductor Device and Semiconductor Device Public/Granted day:2008-06-26
Information query
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