Invention Grant
US07898269B2 Semiconductor device and method for measuring analog channel resistance thereof
失效
用于测量其模拟通道电阻的半导体器件和方法
- Patent Title: Semiconductor device and method for measuring analog channel resistance thereof
- Patent Title (中): 用于测量其模拟通道电阻的半导体器件和方法
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Application No.: US12568259Application Date: 2009-09-28
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Publication No.: US07898269B2Publication Date: 2011-03-01
- Inventor: Chang Soo Jang
- Applicant: Chang Soo Jang
- Applicant Address: KR Seoul
- Assignee: Dongbu Hitek Co., Ltd.
- Current Assignee: Dongbu Hitek Co., Ltd.
- Current Assignee Address: KR Seoul
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner, L.L.P.
- Priority: KR10-2006-0082395 20060829
- Main IPC: G01R27/08
- IPC: G01R27/08 ; H01L23/58
Abstract:
A semiconductor device and a method for measuring an analog channel resistance thereof are provided. The semiconductor device includes a substrate, a gate insulating layer and a gate formed on the substrate, a source and a drain formed in the substrate and at both sides of the gate, a source sense connected to the source, and a drain sense connected to the drain.
Public/Granted literature
- US20100060302A1 SEMICONDUCTOR DEVICE AND METHOD FOR MEASURING ANALOG CHANNEL RESISTANCE THEREOF Public/Granted day:2010-03-11
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