Invention Grant
- Patent Title: Probe for testing a device under test
- Patent Title (中): 探测用于测试被测设备
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Application No.: US12378659Application Date: 2009-02-17
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Publication No.: US07898273B2Publication Date: 2011-03-01
- Inventor: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
- Applicant: K. Reed Gleason , Tim Lesher , Mike Andrews , John Martin
- Applicant Address: US OR Beaverton
- Assignee: Cascade Microtech, Inc.
- Current Assignee: Cascade Microtech, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Chernoff, Vilhauer, McClung & Stenzel
- Main IPC: G01R31/20
- IPC: G01R31/20
Abstract:
A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.
Public/Granted literature
- US20090267625A1 Probe for testing a device under test Public/Granted day:2009-10-29
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