Invention Grant
- Patent Title: Structure of probe
- Patent Title (中): 探头结构
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Application No.: US11745463Application Date: 2007-05-08
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Publication No.: US07898274B2Publication Date: 2011-03-01
- Inventor: Chia-Wei Wu
- Applicant: Chia-Wei Wu
- Applicant Address: TW Taoyuan
- Assignee: Nanya Technology Corporation
- Current Assignee: Nanya Technology Corporation
- Current Assignee Address: TW Taoyuan
- Agency: Jianq Chyun IP Office
- Priority: TW96110718A 20070328
- Main IPC: G01R31/20
- IPC: G01R31/20

Abstract:
A split-type probe is used to contact with an object under test to detect an electrical characteristic thereof. The probe provided by the present invention has a contact head used to contact with the object under test, and a first needle body and a second needle body. The first needle body is connected to the contact head to transmit a testing signal to the object under test for performing detection. In addition, the second needle body is also connected to the contact head to transmit a response signal generated by the object under test due to the testing signal to obtain the electrical characteristic of the object under test.
Public/Granted literature
- US20080238454A1 TESTER AND STRUCTURE OF PROBE THEREOF Public/Granted day:2008-10-02
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