Invention Grant
- Patent Title: Interface for testing semiconductors
- Patent Title (中): 半导体测试接口
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Application No.: US12316511Application Date: 2008-12-12
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Publication No.: US07898281B2Publication Date: 2011-03-01
- Inventor: Peter Andrews , David Hess , Robert New
- Applicant: Peter Andrews , David Hess , Robert New
- Applicant Address: US OR Beaverton
- Assignee: Cascade Mircotech, Inc.
- Current Assignee: Cascade Mircotech, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Chernoff, Vilhauer, McClung & Stenzel
- Main IPC: G01R31/00
- IPC: G01R31/00
Abstract:
A system includes an imaging device for capturing a video sequence and a display for displaying the video in a window of the display and effectively positioning a probe relative to probe pads of a device under test for testing a semiconductor wafer supported by a support of a probing environment.
Public/Granted literature
- US20090134896A1 Interface for testing semiconductors Public/Granted day:2009-05-28
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