Invention Grant
- Patent Title: Method and apparatus for high resolution ZQ calibration
- Patent Title (中): 用于高分辨率ZQ校准的方法和装置
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Application No.: US12613632Application Date: 2009-11-06
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Publication No.: US07898290B2Publication Date: 2011-03-01
- Inventor: Kang Yong Kim
- Applicant: Kang Yong Kim
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: H03K17/16
- IPC: H03K17/16 ; H03K19/003 ; G11C11/00

Abstract:
A method is disclosed for controlling an output impedance of an electronic device of the type having an impedance control terminal to which an external load is to be connected such that a predetermined value of the voltage at the impedance control terminal controls the output impedance of the device. The method is comprised of comparing a reference voltage to a voltage at the impedance control terminal. A variable count signal representing a count value is produced in response to the comparing. The impedance of a variable impedance circuit is varied in response to the count signal, wherein the impedance of the variable impedance circuit controls the voltage at the impedance control terminal. A device connected in parallel with the variable impedance circuit is periodically operated to change (increase/decrease) the impedance of the variable impedance circuit. An apparatus for performing the method is also disclosed.
Public/Granted literature
- US20100045341A1 Method and Apparatus for High Resolution ZQ Calibration Public/Granted day:2010-02-25
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