Invention Grant
US07898430B2 System and method for opportunistic transmission of test probe metadata
有权
用于机会性传输测试探头元数据的系统和方法
- Patent Title: System and method for opportunistic transmission of test probe metadata
- Patent Title (中): 用于机会性传输测试探头元数据的系统和方法
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Application No.: US11230878Application Date: 2005-09-20
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Publication No.: US07898430B2Publication Date: 2011-03-01
- Inventor: Glenn R. Engel , Glen L. Purdy, Jr. , Mutsuya Ii , Jerry J. Liu
- Applicant: Glenn R. Engel , Glen L. Purdy, Jr. , Mutsuya Ii , Jerry J. Liu
- Applicant Address: US CA Milpitas
- Assignee: JDS Uniphase Corporation
- Current Assignee: JDS Uniphase Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Pequignot + Myers LLC
- Agent Matthew A. Pequignot
- Main IPC: G08C17/00
- IPC: G08C17/00

Abstract:
Measurement sensors are designed to provide metadata to data recording devices in an opportunistic manner to conserve bandwidth and/or power. In one embodiment, the metadata is communicated to the recording device during opportunistic periods, such as, for example, when actual data transmission can be skipped, or when battery level is high, or when there is enough bandwidth, i.e., other sensors are not using the full allocated bandwidth. In one embodiment, a plurality of sensors each only send a portion of their data such that all the portions taken together form the complete metadata. In another embodiment, each sensor only sends an identification of its type and the receiving device “looks up” the full metadata from a database.
Public/Granted literature
- US20070067360A1 System and method for opportunistic transmission of test probe metadata Public/Granted day:2007-03-22
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