Invention Grant
- Patent Title: Measurement method and measurement apparatus
- Patent Title (中): 测量方法和测量装置
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Application No.: US12207924Application Date: 2008-09-10
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Publication No.: US07898649B2Publication Date: 2011-03-01
- Inventor: Takahiro Masumura
- Applicant: Takahiro Masumura
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2007-237010 20070912
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
A measurement method of measuring a spectroscopic characteristic inside of a scattering medium includesa first step of measuring the spectroscopic characteristic of the scattering medium by using diffuse optical tomography by irradiating light into the scattering medium, a second step of measuring the spectroscopic characteristic of the scattering medium by using acousto-optical tomography or photo acoustic tomography by irradiating light into the scattering medium, and a third step of making an assumption of a distribution of the spectroscopic characteristic inside of the scattering medium and of changing the assumption such that a difference between a predicted value of the spectroscopic characteristic derived from the assumption and a measured value obtained in the first step can fall upon a permissible range. The third step uses data obtained in the second step for at least one of the parameter: an initial value, a constraint condition, or a boundary condition.
Public/Granted literature
- US20090066949A1 MEASUREMENT METHOD AND MEASUREMENT APPARATUS Public/Granted day:2009-03-12
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