Invention Grant
- Patent Title: Foreign matter inspection apparatus
- Patent Title (中): 异物检查仪器
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Application No.: US12003123Application Date: 2007-12-20
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Publication No.: US07898653B2Publication Date: 2011-03-01
- Inventor: Eiji Imai , Masami Ooyama , Hideyuki Okamoto , Hiroyuki Yamashita
- Applicant: Eiji Imai , Masami Ooyama , Hideyuki Okamoto , Hiroyuki Yamashita
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Priority: JP2006-342409 20061220; JP2006-350814 20061227
- Main IPC: G01N21/00
- IPC: G01N21/00

Abstract:
Selection with alignment marks of an optimal template, its identification and similarity judgment are conducted by a calculation function of a correlation value provided to a foreign matter inspection apparatus. In other words, the foreign matter inspection apparatus includes unit for registering feature points of alignment marks formed on a surface of an inspected object, unit for collecting image data of the alignment marks formed on the surface of the inspected object and a data processor for extracting a feature point from the image data and calculating a correlation value of both feature points, and registers the image data of the alignment mark on the basis of a threshold value of the correlation value.
Public/Granted literature
- US20080151234A1 Foreign matter inspection apparatus Public/Granted day:2008-06-26
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