Invention Grant
- Patent Title: Resistance change memory
- Patent Title (中): 电阻变化记忆
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Application No.: US12404115Application Date: 2009-03-13
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Publication No.: US07898845B2Publication Date: 2011-03-01
- Inventor: Kenji Tsuchida
- Applicant: Kenji Tsuchida
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Knobbe, Martens, Olson & Bear LLP
- Priority: JP2008-163770 20080623
- Main IPC: G11C11/00
- IPC: G11C11/00

Abstract:
A resistance change memory includes first and second memory cell arrays which are adjacent to each other in a first direction, first and second reference cell arrays paired with the first and second memory cell arrays, a first sense amplifier shared by the first and second memory cell arrays and arranged between the first and second memory cell arrays, a first data bus which transfers data of a first readout cell in the first memory cell array to the first sense amplifier, and a second data bus which transfers data of a first reference cell in the first reference cell array to the first sense amplifier. The first and second data buses run on both sides of the first sense amplifier in a second direction and cross each other while sandwiching the first sense amplifier.
Public/Granted literature
- US20090316471A1 RESISTANCE CHANGE MEMORY Public/Granted day:2009-12-24
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