Invention Grant
US07898884B2 Semiconductor device and test method therefor 有权
半导体器件及其测试方法

Semiconductor device and test method therefor
Abstract:
Disclosed is a semiconductor device including internal power supply generating circuits for generating internal power supplies and data terminals via which data signals are output or input/output. The internal power supply monitor terminals are in common use with the data terminals. The semiconductor device also includes selection circuits for selecting, by a test control signal, whether or not output voltages of the internal power supply generating circuits are to be output to the data terminals.
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