Invention Grant
- Patent Title: Semiconductor device and test method therefor
- Patent Title (中): 半导体器件及其测试方法
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Application No.: US12292432Application Date: 2008-11-19
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Publication No.: US07898884B2Publication Date: 2011-03-01
- Inventor: Chiaki Dono , Atsushi Fujikawa
- Applicant: Chiaki Dono , Atsushi Fujikawa
- Applicant Address: JP Chuo-ku, Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Chuo-ku, Tokyo
- Agency: McGinn IP Law Group, PLLC
- Priority: JP2008-264140 20081010
- Main IPC: G11C7/00
- IPC: G11C7/00

Abstract:
Disclosed is a semiconductor device including internal power supply generating circuits for generating internal power supplies and data terminals via which data signals are output or input/output. The internal power supply monitor terminals are in common use with the data terminals. The semiconductor device also includes selection circuits for selecting, by a test control signal, whether or not output voltages of the internal power supply generating circuits are to be output to the data terminals.
Public/Granted literature
- US20100090675A1 Semiconductor device and test method therefor Public/Granted day:2010-04-15
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