Invention Grant
US07898900B2 Latency counter, semiconductor memory device including the same, and data processing system
有权
延迟计数器,包括其的半导体存储器件和数据处理系统
- Patent Title: Latency counter, semiconductor memory device including the same, and data processing system
- Patent Title (中): 延迟计数器,包括其的半导体存储器件和数据处理系统
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Application No.: US12467620Application Date: 2009-05-18
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Publication No.: US07898900B2Publication Date: 2011-03-01
- Inventor: Hiroki Fujisawa
- Applicant: Hiroki Fujisawa
- Applicant Address: JP Tokyo
- Assignee: Elpida Memory, Inc.
- Current Assignee: Elpida Memory, Inc.
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2008-129088 20080516
- Main IPC: G11C8/00
- IPC: G11C8/00

Abstract:
To provide a latency counter capable of increasing the signal quality of outputted internal commands. There is provided a point-shift FIFO circuit controlled by count values of a counter circuit. The point-shift FIFO circuit includes: a first wired-OR circuit that combines outputs of first latch circuits; a second wired-OR circuit that combines outputs of second latch circuits; a gate circuit that combines outputs of the first and second wired-OR circuits; and reset circuits that reset the first and second wired-OR circuits, respectively, based on the count value of the counter circuit. According to the present invention, as compared to a case that outputs of all the latch circuits are wired-OR connected, output loads are more reduced. Thus, a high signal quality can be obtained.
Public/Granted literature
- US20090285034A1 LATENCY COUNTER, SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME, AND DATA PROCESSING SYSTEM Public/Granted day:2009-11-19
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