Invention Grant
US07898900B2 Latency counter, semiconductor memory device including the same, and data processing system 有权
延迟计数器,包括其的半导体存储器件和数据处理系统

  • Patent Title: Latency counter, semiconductor memory device including the same, and data processing system
  • Patent Title (中): 延迟计数器,包括其的半导体存储器件和数据处理系统
  • Application No.: US12467620
    Application Date: 2009-05-18
  • Publication No.: US07898900B2
    Publication Date: 2011-03-01
  • Inventor: Hiroki Fujisawa
  • Applicant: Hiroki Fujisawa
  • Applicant Address: JP Tokyo
  • Assignee: Elpida Memory, Inc.
  • Current Assignee: Elpida Memory, Inc.
  • Current Assignee Address: JP Tokyo
  • Agency: Sughrue Mion, PLLC
  • Priority: JP2008-129088 20080516
  • Main IPC: G11C8/00
  • IPC: G11C8/00
Latency counter, semiconductor memory device including the same, and data processing system
Abstract:
To provide a latency counter capable of increasing the signal quality of outputted internal commands. There is provided a point-shift FIFO circuit controlled by count values of a counter circuit. The point-shift FIFO circuit includes: a first wired-OR circuit that combines outputs of first latch circuits; a second wired-OR circuit that combines outputs of second latch circuits; a gate circuit that combines outputs of the first and second wired-OR circuits; and reset circuits that reset the first and second wired-OR circuits, respectively, based on the count value of the counter circuit. According to the present invention, as compared to a case that outputs of all the latch circuits are wired-OR connected, output loads are more reduced. Thus, a high signal quality can be obtained.
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