Invention Grant
- Patent Title: Automated x-ray fluorescence analysis
- Patent Title (中): 自动X射线荧光分析
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Application No.: US12426022Application Date: 2009-04-17
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Publication No.: US07899153B2Publication Date: 2011-03-01
- Inventor: Michael E. Dugas , Lee Grodzins , Stephen I. Shefsky
- Applicant: Michael E. Dugas , Lee Grodzins , Stephen I. Shefsky
- Applicant Address: US MA Billerica
- Assignee: Thermo Niton Analyzers LLC
- Current Assignee: Thermo Niton Analyzers LLC
- Current Assignee Address: US MA Billerica
- Agent Charles B. Katz
- Main IPC: G01N23/223
- IPC: G01N23/223

Abstract:
A method for classifying a sample based upon a complete spectral analysis. The sample is illuminated with penetrating radiation and an initial complete spectral analysis is performed based on spectral resolution of resonant fluorescence lines emitted at the surface, or within the volume, of the sample. If the initial complete spectral analysis yields the composition of the sample to within acceptable limits, analysis values are output to the user. Otherwise, further analysis, informed by the results if the initial complete spectral analysis, is performed.
Public/Granted literature
- US20090262889A1 Automated X-Ray Fluorescence Analysis Public/Granted day:2009-10-22
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