Invention Grant
US07899154B2 Small spot and high energy resolution XRF system for valence state determination
有权
用于价态确定的小点和高能量分辨率XRF系统
- Patent Title: Small spot and high energy resolution XRF system for valence state determination
- Patent Title (中): 用于价态确定的小点和高能量分辨率XRF系统
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Application No.: US12531142Application Date: 2008-03-14
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Publication No.: US07899154B2Publication Date: 2011-03-01
- Inventor: Zewu Chen , Li Danhong
- Applicant: Zewu Chen , Li Danhong
- Applicant Address: US NY East Greenbush
- Assignee: X-Ray Optical Systems, Inc.
- Current Assignee: X-Ray Optical Systems, Inc.
- Current Assignee Address: US NY East Greenbush
- Agency: Heslin Rothenberg Farley & Mesiti P.C.
- Agent Jeffrey Klembczyk, Esq.; Kevin P. Radigan, Esq.
- International Application: PCT/US2008/056944 WO 20080314
- International Announcement: WO2008/112950 WO 20080918
- Main IPC: G01N23/223
- IPC: G01N23/223

Abstract:
An x-ray fluorescence technique for determining a valence state of a sample. An x-ray excitation path is provided for exciting a sample with x-rays; and an x-ray detection path is provided for detecting fluorescence emitted from the sample, and focusing the emitted fluorescence to a focal spot. The detection path may include a monochromating detection optic for focusing the fluorescence; and also may include a detector on which the focal spot is focused. The precise positions of the focal spot are sensed, from which valence states of the sample can be determined; and/or the detection optic can be rocked across certain angles of incidence, to change the Bragg conditions, thereby sensing different valence states within the sample.
Public/Granted literature
- US20100046702A1 SMALL SPOT AND HIGH ENERGY RESOLUTION XRF SYSTEM FOR VALENCE STATE DETERMINATION Public/Granted day:2010-02-25
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