Invention Grant
US07899237B2 Method, apparatus and system for detecting anomalies in mixed signal devices
有权
用于检测混合信号装置异常的方法，装置和系统
- Patent Title: Method, apparatus and system for detecting anomalies in mixed signal devices
- Patent Title (中): 用于检测混合信号装置异常的方法，装置和系统
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Application No.: US11683548Application Date: 2007-03-08
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Publication No.: US07899237B2Publication Date: 2011-03-01
- Inventor: Dat T. Nguyen , Thao To , David Maxwell , Naweed Anjum
- Applicant: Dat T. Nguyen , Thao To , David Maxwell , Naweed Anjum
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Warren L. Franz; Wade J. Brady; Frederick J. Telecky, Jr.
- Main IPC: G06K9/00
- IPC: G06K9/00
Abstract:
An embodiment relates generally to a method of testing a mixed signal device. The method includes monitoring multiple parameters of the mixed signal device and scanning the mixed signal device with an optical source. The method also includes forming multiple windows, where each window is assigned to a respective parameter. The method further includes comparing an image from a respective image to a reference image to determine an existence of an anomaly.
Public/Granted literature
- US20080219546A1 METHOD, APPARATUS AND SYSTEM FOR DETECTING ANOMALIES IN MIXED SIGNAL DEVICES Public/Granted day:2008-09-11
Information query
