Invention Grant
- Patent Title: High-sensitivity, high-resolution detector devices and arrays
- Patent Title (中): 高灵敏度,高分辨率的检测器和阵列
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Application No.: US11450025Application Date: 2006-06-09
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Publication No.: US07899339B2Publication Date: 2011-03-01
- Inventor: Dimitry A. Shushakov , Vitaly E. Shubin
- Applicant: Dimitry A. Shushakov , Vitaly E. Shubin
- Applicant Address: US NY Brooklyn
- Assignee: Amplification Technologies Inc.
- Current Assignee: Amplification Technologies Inc.
- Current Assignee Address: US NY Brooklyn
- Agency: Frommer Lawrence & Haug LLP
- Main IPC: H04B10/06
- IPC: H04B10/06 ; H03F3/08 ; H01L31/107

Abstract:
Avalanche amplification structures including electrodes, an avalanche region, a quantifier, an integrator, a governor, and a substrate arranged to detect a weak signal composed of as few as several electrons are presented. Quantifier regulates the avalanche process. Integrator accumulates a signal charge. Governor drains the integrator and controls the quantifier. Avalanche amplifying structures include: normal quantifier, reverse bias designs; normal quantifier, normal bias designs; lateral quantifier, normal bias designs; changeable quantifier, normal bias, adjusting electrode designs; normal quantifier, normal bias, adjusting electrode designs; and lateral quantifier, normal bias, annular integrator designs. Avalanche amplification structures are likewise arranged to provide arrays of multi-channel devices. The described invention is expected to be used within photodetectors, electron amplifiers, chemical and biological sensors, and chemical and biological chips with lab-on-a-chip applications. Structures have immediately applicability to devices critical to homeland defense.
Public/Granted literature
- US20060249747A1 High-sensitivity, high-resolution detector devices and arrays Public/Granted day:2006-11-09
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