Invention Grant
- Patent Title: Method and program for selecting product to be inspected
- Patent Title (中): 选择待检查产品的方法和程序
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Application No.: US12109769Application Date: 2008-04-25
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Publication No.: US07899567B2Publication Date: 2011-03-01
- Inventor: Masataka Tanaka , Takaaki Kumazawa , Masayuki Ichinohe
- Applicant: Masataka Tanaka , Takaaki Kumazawa , Masayuki Ichinohe
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, P.C.
- Priority: JP2007-117957 20070427
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G01N37/00

Abstract:
An inspection-required product selection method and program for minimizing the number of investigation steps at the time of a defect occurrence for a product placed on the market are disclosed. A combination of product lots to be inspected is assumed based on the information on the material lots used for a product lot scheduled for production for a predetermined future period and the number of the product lots inspected during the same period. The number of the material lots not included in the product lots to be inspected is totalized for each product lot, and the statistical values are calculated for all the conceivable combinations of the product lots. The combination of the product lots optimizing the statistical values is selected for inspection.
Public/Granted literature
- US20080269936A1 METHOD AND PROGRAM FOR SELECTING PRODUCT TO BE INSPECTED Public/Granted day:2008-10-30
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