Invention Grant
- Patent Title: Measuring system and calibration method
- Patent Title (中): 测量系统和校准方法
-
Application No.: US11822093Application Date: 2007-07-02
-
Publication No.: US07899577B2Publication Date: 2011-03-01
- Inventor: Kazunori Ban , Katsutoshi Takizawa , Gang Shen
- Applicant: Kazunori Ban , Katsutoshi Takizawa , Gang Shen
- Applicant Address: JP Minamitsuru-gun, Yamanashi
- Assignee: Fanuc Ltd
- Current Assignee: Fanuc Ltd
- Current Assignee Address: JP Minamitsuru-gun, Yamanashi
- Agency: Drinker Biddle & Reath LLP
- Priority: JP2006-183375 20060703
- Main IPC: G06F19/00
- IPC: G06F19/00

Abstract:
A measuring system and a calibration method for automatically calculating errors of mechanical parameters with high accuracy and correcting the parameters, by means of a relatively small and inexpensive measuring device. In relation to a plurality of positions of measurement, a robot is automatically moved such that, on a light receiving surface of a camera, the distance between the centers of an ellipse indicating a mark of a target and a circle of representing the shape of the target, and the difference between the length of the long axis of the ellipse and the diameter of the circle are within a predetermined error range.
Public/Granted literature
- US20080004750A1 Measuring system and calibration method Public/Granted day:2008-01-03
Information query