Invention Grant
- Patent Title: Sequential resistivity imaging with asymmetric electrode arrays
- Patent Title (中): 具有不对称电极阵列的顺序电阻率成像
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Application No.: US12202491Application Date: 2008-09-02
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Publication No.: US07899622B2Publication Date: 2011-03-01
- Inventor: Tsili Wang
- Applicant: Tsili Wang
- Applicant Address: US TX Houston
- Assignee: Baker Hughes Incorporated
- Current Assignee: Baker Hughes Incorporated
- Current Assignee Address: US TX Houston
- Agency: Cantor Colburn LLP
- Main IPC: G01V1/40
- IPC: G01V1/40
Abstract:
A method and instrument provide a very detailed symmetric resistivity image of a formation. A first asymmetric resistivity image is collected from a first arrangement of electrodes, which form an asymmetric sensor. A second asymmetric resistivity image is collected from a second arrangement of electrodes, which form an asymmetric sensor. The first image and the second image overlap each other. The images are assembled about a selected reference point and then processed to provide the very detailed symmetric resistivity image.
Public/Granted literature
- US20090309602A1 SEQUENTIAL RESISTIVITY IMAGING WITH ASYMMETRIC ELECTRODE ARRAYS Public/Granted day:2009-12-17
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