Invention Grant
- Patent Title: System and method of measuring methylation of nucleic acids
- Patent Title (中): 测量核酸甲基化的系统和方法
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Application No.: US11961943Application Date: 2007-12-20
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Publication No.: US07899626B2Publication Date: 2011-03-01
- Inventor: Semyon Kruglyak , Marina Bibikova , Eugene Chudin
- Applicant: Semyon Kruglyak , Marina Bibikova , Eugene Chudin
- Applicant Address: US CA San Diego
- Assignee: Illumina, Inc.
- Current Assignee: Illumina, Inc.
- Current Assignee Address: US CA San Diego
- Agency: Knobbe Martens Olson & Bear LLP
- Main IPC: G06F7/00
- IPC: G06F7/00
Abstract:
The present embodiments relate to a system and method of measuring the methylation level of DNA. Some embodiments relate to a system and method of measuring methylation level of DNA with a gene array.
Public/Granted literature
- US20080166728A1 System and method of measuring methylation of nucleic acids Public/Granted day:2008-07-10
Information query
