Invention Grant
- Patent Title: Optimized RFID/NFC BER testing
- Patent Title (中): 优化RFID / NFC BER测试
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Application No.: US11178432Application Date: 2005-07-12
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Publication No.: US07899642B2Publication Date: 2011-03-01
- Inventor: Graham Rowse , Joe Pendlebury
- Applicant: Graham Rowse , Joe Pendlebury
- Applicant Address: FI Espoo
- Assignee: Nokia Corporation
- Current Assignee: Nokia Corporation
- Current Assignee Address: FI Espoo
- Agency: Locke Lord Bissell & Liddell
- Main IPC: G01M19/00
- IPC: G01M19/00

Abstract:
A system and method for testing communication performance between two wireless communication devices. A value table is used to determine a test string in both the unit under test and another wireless device. An initiating device transmits data to the secondary device, which may check the incoming data for errors against an “expected” data string. The secondary device may then correct the incoming data (if necessary) and transmit it back to the initiating device. The initiating device may check this data and combine it with data from the secondary device in order to determine an overall bit error rate (BER) and/or packet error rate (PER).
Public/Granted literature
- US20070014341A1 Optimized RFID/NFC BER testing Public/Granted day:2007-01-18
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