Invention Grant
- Patent Title: Enabling test modes of individual integrated circuit devices out of a plurality of integrated circuit devices
- Patent Title (中): 启用多个集成电路设备中的各个集成电路设备的测试模式
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Application No.: US11043011Application Date: 2005-01-25
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Publication No.: US07900099B2Publication Date: 2011-03-01
- Inventor: Judy Wan , Benjamin Louie
- Applicant: Judy Wan , Benjamin Louie
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Leffert Jay & Polglaze, P.A.
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G01R31/28 ; G01R31/26
Abstract:
Methods and apparatus are provided. A common test-mode enable signal is received at two or more integrated circuit devices of an electronic system. A test mode of only an integrated circuit device of the two or more integrated circuit devices that was last to receive a valid command is enabled in response to the common test-mode enable signal.
Public/Granted literature
Information query
