Invention Grant
- Patent Title: Error detection in an integrated circuit
- Patent Title (中): 集成电路中的错误检测
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Application No.: US12395490Application Date: 2009-02-27
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Publication No.: US07900114B2Publication Date: 2011-03-01
- Inventor: Stephan Henzler , Martin Wirnshofer , Dominik Lorenz
- Applicant: Stephan Henzler , Martin Wirnshofer , Dominik Lorenz
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Lee & Hayes, PLLC
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
An electronic device includes an integrated circuit operating on the basis of an operating clock signal, an error detection circuit and a control circuit coupled to the error detection circuit. The control circuit is configured to increase the frequency of the operating clock signal starting from a nominal operating frequency of the integrated circuit, to evaluate a frequency increment at which an error is detected by the error detection circuit, and to reset the frequency of the operating clock signal to said nominal frequency.
Public/Granted literature
- US20100223520A1 Error Detection in an Integrated Circuit Public/Granted day:2010-09-02
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