Invention Grant
- Patent Title: Determining a design attribute by estimation and by calibration of estimated value
- Patent Title (中): 通过估计和校准估计值确定设计属性
-
Application No.: US11731565Application Date: 2007-03-30
-
Publication No.: US07900165B2Publication Date: 2011-03-01
- Inventor: Nahmsuk Oh , Peivand Fallah-Tehrani , Alireza Kasnavi , Subramanyam Sripada
- Applicant: Nahmsuk Oh , Peivand Fallah-Tehrani , Alireza Kasnavi , Subramanyam Sripada
- Applicant Address: US CA Mountain View
- Assignee: Synopsys, Inc.
- Current Assignee: Synopsys, Inc.
- Current Assignee Address: US CA Mountain View
- Agency: Silicon Valley Patent Group LLP
- Agent Omkar Suryadevara
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F9/45 ; G06F17/10

Abstract:
A computer-implemented method of determining an attribute of a circuit includes using a computationally expensive technique to simulate the attribute (such as timing delay or slew) of a portion of the circuit, at predetermined values of various parameters (e.g. nominal values of channel length or metal width), to obtain at least a first value of the attribute. The method also uses a computationally inexpensive technique to estimate the same attribute, thereby to obtain at least a second value which is less accurate than the first value. Then the computationally inexpensive technique is repeatedly used on other values of the parameter(s), to obtain a number of additional second values of the attribute. Applying to the additional second values, a function obtained by calibrating the at least one second value to the at least one first value, can yield calibrated estimates very quickly, which represent the attribute's variation relatively accurately.
Public/Granted literature
- US20080243414A1 Determining a design attribute by estimation and by calibration of estimated value Public/Granted day:2008-10-02
Information query