Invention Grant
US07900497B2 System, method and apparatus for obtaining true roughness of granular media
有权
用于获得粒状介质真实粗糙度的系统,方法和装置
- Patent Title: System, method and apparatus for obtaining true roughness of granular media
- Patent Title (中): 用于获得粒状介质真实粗糙度的系统,方法和装置
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Application No.: US11950021Application Date: 2007-12-04
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Publication No.: US07900497B2Publication Date: 2011-03-08
- Inventor: Qing Dai , Bruno Marchon , Tsai-Wei Wu
- Applicant: Qing Dai , Bruno Marchon , Tsai-Wei Wu
- Applicant Address: NL Amsterdam
- Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee: Hitachi Global Storage Technologies Netherlands B.V.
- Current Assignee Address: NL Amsterdam
- Main IPC: G01B21/30
- IPC: G01B21/30

Abstract:
The true roughness of highly granular perpendicular media is measured by forming an inverse replica of the surface of the media. The invention enables AFM measurements of granular media valley depth to more consistently predict the corrosion performance of the media. A liquid resist is used to first replicate the media topography and form the inverse replica. The narrow valleys in the original media are precisely modeled as sharp peaks on the replica. The height of the peaks are readily measured with an AFM tip. The resulting image is a negative of the original surface.
Public/Granted literature
- US20090139314A1 SYSTEM, METHOD AND APPARATUS FOR OBTAINING TRUE ROUGHNESS OF GRANULAR MEDIA Public/Granted day:2009-06-04
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