Invention Grant
- Patent Title: Ultrasonic flaw detection apparatus and ultrasonic flaw detection method
- Patent Title (中): 超声波探伤仪及超声波探伤方法
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Application No.: US12304912Application Date: 2007-07-06
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Publication No.: US07900516B2Publication Date: 2011-03-08
- Inventor: Hiroyuki Fukutomi , Shan Lin , Tetsuo Fukuchi
- Applicant: Hiroyuki Fukutomi , Shan Lin , Tetsuo Fukuchi
- Applicant Address: JP Tokyo
- Assignee: Central Research Institute of Electric Power Industry
- Current Assignee: Central Research Institute of Electric Power Industry
- Current Assignee Address: JP Tokyo
- Agency: Notaro, Michalos & Zaccaria P.C.
- Priority: JP2006-190016 20060711; JP2006-286202 20061020; JP2007-010134 20070119
- International Application: PCT/JP2007/000740 WO 20070706
- International Announcement: WO2008/007460 WO 20080117
- Main IPC: G01N29/07
- IPC: G01N29/07

Abstract:
To simply and accurately determine the position of an edge, the depth or the height of a flaw including a surface crack, a corroded portion near the surface layer of a thick specimen, and a minute damage.An ultrasonic flaw detection method causes an ultrasonic wave 16 to be incident on a specimen 6 from an oblique direction, detects a diffracted wave 17 generated at an edge of a flaw 20 in the specimen 6 above the flaw, and determines the position of the edge of the flaw 20 from a front surface 13 of the specimen 6 using a triangular method from an entire beam path Wt of a component 18, which directly propagates above the flaw 20, of the diffracted wave, the entire beam path passing through the flaw from the position of incidence of the component 18, and an interval S between the position of incidence and the position of detection of the ultrasonic wave or from the difference (tt−ts) between the propagation time of a surface wave 15, to which the above relations reflect, to reception and the propagation time of the diffracted wave 18, which directly propagates above the flaw, to reception.
Public/Granted literature
- US20090199642A1 ULTRASONIC FLAW DETECTION APPARATUS AND ULTRASONIC FLAW DETECTION METHOD Public/Granted day:2009-08-13
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